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	<title>13.56 MHz - RFID News</title>
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	<link>https://www.rfidnews.co.uk</link>
	<description>New RFID Implementations, Hardware and Tags</description>
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		<title>CISC Semiconductor NFC Interoperability Lab Expansion with COMPRION TraceCase</title>
		<link>https://www.rfidnews.co.uk/2026/07/01/cisc-semiconductor-nfc-interoperability-lab-expansion-with-comprion-tracecase/?utm_source=rss&#038;utm_medium=rss&#038;utm_campaign=cisc-semiconductor-nfc-interoperability-lab-expansion-with-comprion-tracecase</link>
		
		<dc:creator><![CDATA[Matt Houldsworth]]></dc:creator>
		<pubDate>Wed, 01 Jul 2026 09:22:00 +0000</pubDate>
				<category><![CDATA[Contactless Payment]]></category>
		<category><![CDATA[Hardware]]></category>
		<category><![CDATA[NFC]]></category>
		<category><![CDATA[R&D]]></category>
		<category><![CDATA[13.56 MHz]]></category>
		<category><![CDATA[CISC Semiconductor]]></category>
		<category><![CDATA[COMPRION]]></category>
		<category><![CDATA[contactless]]></category>
		<category><![CDATA[H-field measurement]]></category>
		<category><![CDATA[interoperability]]></category>
		<category><![CDATA[NFC testing]]></category>
		<category><![CDATA[POS terminals]]></category>
		<category><![CDATA[protocol analysis]]></category>
		<category><![CDATA[secure element]]></category>
		<category><![CDATA[Smart Cards]]></category>
		<category><![CDATA[TraceCase]]></category>
		<category><![CDATA[Wearables]]></category>
		<guid isPermaLink="false">https://www.rfidnews.co.uk/?p=992</guid>

					<description><![CDATA[<p>CISC Semiconductor has expanded its NFC interoperability testing laboratory in Graz, Austria, integrating COMPRION&#8217;s TraceCase sniffer solution as the primary tool for capturing and analyzing Near Field Communication exchanges. The upgrade strengthens the lab&#8217;s ability to decode complex interactions between mobile devices, secure elements, and contactless service infrastructure. The TraceCase sniffer provides protocol-level analysis of NFC transactions involving embedded secure elements (eSEs), UICCs, and contactless readers. Engineers at CISC can now decode multi-layered communication sequences [&#8230;]</p>
<p>The post <a href="https://www.rfidnews.co.uk/2026/07/01/cisc-semiconductor-nfc-interoperability-lab-expansion-with-comprion-tracecase/">CISC Semiconductor NFC Interoperability Lab Expansion with COMPRION TraceCase</a> first appeared on <a href="https://www.rfidnews.co.uk">RFID News</a>.</p>]]></description>
										<content:encoded><![CDATA[<p>CISC Semiconductor has expanded its NFC interoperability testing laboratory in Graz, Austria, integrating COMPRION&#8217;s TraceCase sniffer solution as the primary tool for capturing and analyzing Near Field Communication exchanges. The upgrade strengthens the lab&#8217;s ability to decode complex interactions between mobile devices, secure elements, and contactless service infrastructure.</p>
<p>The TraceCase sniffer provides protocol-level analysis of NFC transactions involving embedded secure elements (eSEs), UICCs, and contactless readers. Engineers at CISC can now decode multi-layered communication sequences in real time, quickly identifying protocol deviations and unexpected device behavior that would otherwise require extensive manual investigation. For a lab that routinely tests interoperability across mobile phones, wearables, POS terminals, and smart cards, this level of visibility into the protocol stack is a significant operational gain.</p>
<p>One of the most notable technical features of the TraceCase platform is its integrated H-field measurement capability. NFC operates at 13.56 MHz and relies on magnetic coupling between devices, which means that antenna design, metallic enclosures, and environmental shielding all have a direct impact on signal stability and communication reliability. The integrated H-field measurement allows CISC engineers to observe protocol traces and magnetic field strength simultaneously, correlating signal-layer behavior with protocol-layer events in a single capture session. This dual-layer insight is particularly valuable when diagnosing intermittent failures that stem from marginal RF conditions rather than software defects.</p>
<p>From a workflow perspective, the compact and portable form factor of the TraceCase unit fits naturally into CISC&#8217;s existing automated test setups. Engineers report faster setup times for signal captures, more granular filtering options during trace analysis, and shorter debugging cycles overall. These efficiency improvements translate directly into faster project turnaround times for CISC&#8217;s clients, who depend on the lab for comprehensive interoperability reports covering application, protocol, data, timing, and signal layers.</p>
<p>CISC Semiconductor operates one of the more established NFC interoperability testing facilities in Europe. The lab&#8217;s fully automated test environments simulate real-world communication scenarios using diverse counterpart devices, generating detailed reports with tabular data, graphical analysis, and optional low-level debugging information. The addition of COMPRION&#8217;s sniffer technology adds another dimension to this testing capability, particularly for clients developing contactless payment solutions, transit ticketing systems, and access control applications where protocol compliance and signal integrity are non-negotiable requirements.</p>
<p>The partnership between CISC and COMPRION reflects a broader industry trend toward more sophisticated NFC testing infrastructure. As the number of NFC-enabled devices continues to grow and use cases expand beyond payment into areas such as digital identity, device provisioning, and IoT configuration, the demand for rigorous interoperability validation is increasing. Labs that can offer combined protocol and RF signal analysis are better positioned to catch the subtle interaction failures that surface when devices from different manufacturers attempt to communicate in varied physical environments.</p>
<p>Read more at <a href="https://www.cisc.at/blog/comprion_sniffer/" target="_blank" rel="noopener noreferrer">https://www.cisc.at/blog/comprion_sniffer/</a></p><p>The post <a href="https://www.rfidnews.co.uk/2026/07/01/cisc-semiconductor-nfc-interoperability-lab-expansion-with-comprion-tracecase/">CISC Semiconductor NFC Interoperability Lab Expansion with COMPRION TraceCase</a> first appeared on <a href="https://www.rfidnews.co.uk">RFID News</a>.</p>]]></content:encoded>
					
		
		
			</item>
		<item>
		<title>DigiKey Collaborates with STMicroelectronics and Ultra Librarian to Deliver Enhanced eDesignSuite Integration</title>
		<link>https://www.rfidnews.co.uk/2026/03/19/digikey-collaborates-with-stmicroelectronics-and-ultra-librarian-to-deliver-enhanced-edesignsuite-integration/?utm_source=rss&#038;utm_medium=rss&#038;utm_campaign=digikey-collaborates-with-stmicroelectronics-and-ultra-librarian-to-deliver-enhanced-edesignsuite-integration</link>
		
		<dc:creator><![CDATA[Matt Houldsworth]]></dc:creator>
		<pubDate>Thu, 19 Mar 2026 15:18:30 +0000</pubDate>
				<category><![CDATA[Hardware]]></category>
		<category><![CDATA[HF]]></category>
		<category><![CDATA[Manufacturer]]></category>
		<category><![CDATA[NFC]]></category>
		<category><![CDATA[R&D]]></category>
		<category><![CDATA[Software]]></category>
		<category><![CDATA[13.56 MHz]]></category>
		<category><![CDATA[Antenna Design]]></category>
		<category><![CDATA[DigiKey]]></category>
		<category><![CDATA[eDesignSuite]]></category>
		<category><![CDATA[ioT]]></category>
		<category><![CDATA[rfid]]></category>
		<category><![CDATA[ST25]]></category>
		<category><![CDATA[STMicroelectronics]]></category>
		<category><![CDATA[Ultra Librarian]]></category>
		<guid isPermaLink="false">https://www.rfidnews.co.uk/index.php/2026/03/19/digikey-collaborates-with-stmicroelectronics-and-ultra-librarian-to-deliver-enhanced-edesignsuite-integration/</guid>

					<description><![CDATA[<p>DigiKey has announced a new collaboration with STMicroelectronics and Ultra Librarian that brings tighter integration between ST&#8217;s eDesignSuite platform, Ultra Librarian&#8217;s component library, and DigiKey&#8217;s distribution network. The three-way partnership aims to create a smoother path from circuit design through to component procurement for engineers working with ST products. STMicroelectronics&#8217; eDesignSuite is a well-established collection of design utilities that helps engineers specify application use cases, select the right IC or discrete component, simulate circuit performance, [&#8230;]</p>
<p>The post <a href="https://www.rfidnews.co.uk/2026/03/19/digikey-collaborates-with-stmicroelectronics-and-ultra-librarian-to-deliver-enhanced-edesignsuite-integration/">DigiKey Collaborates with STMicroelectronics and Ultra Librarian to Deliver Enhanced eDesignSuite Integration</a> first appeared on <a href="https://www.rfidnews.co.uk">RFID News</a>.</p>]]></description>
										<content:encoded><![CDATA[<p>DigiKey has announced a new collaboration with STMicroelectronics and Ultra Librarian that brings tighter integration between ST&#8217;s eDesignSuite platform, Ultra Librarian&#8217;s component library, and DigiKey&#8217;s distribution network. The three-way partnership aims to create a smoother path from circuit design through to component procurement for engineers working with ST products.</p>
<p>STMicroelectronics&#8217; eDesignSuite is a well-established collection of design utilities that helps engineers specify application use cases, select the right IC or discrete component, simulate circuit performance, and prepare prototypes. For NFC and RFID designers, the suite is particularly valuable because it includes dedicated antenna design calculators for 13.56 MHz systems. The NFC Inductance calculator lets users input antenna geometry values to compute expected inductance, which is critical for tuning resonance frequency. The NFC Tuning Circuit calculator goes further, providing matching network component values for ST25R series reader ICs, including the capacitor values needed for Automatic Antenna Tuning (AAT) circuits.</p>
<p>This matters because STMicroelectronics has built one of the most comprehensive NFC/RFID portfolios in the industry through its ST25 product family. The ST25R series of reader ICs, including the ST25R3916 and the automotive-grade ST25R3920B, support multiple protocols at 13.56 MHz including ISO 14443 Type A and B, ISO 15693, and NFC Forum standards. On the tag side, the ST25DV dynamic NFC/RFID tags offer both a 13.56 MHz RF interface and an I2C connection to a host microcontroller, making them popular choices for IoT devices, smart labels, and industrial applications.</p>
<p>Ultra Librarian contributes its cloud-based library of over 8 million symbols, footprints, and 3D STEP models with vendor-neutral ECAD output. Engineers can pull verified component data directly into their PCB design tools without worrying about compatibility issues. This new collaboration builds on an earlier partnership between DigiKey and Ultra Librarian announced in February 2025, which integrated DigiKey&#8217;s myLists with Ultra Librarian&#8217;s UltraBOM tool for streamlined bill of materials management.</p>
<p>By connecting these three platforms, the collaboration creates an end-to-end digital workflow. Engineers can simulate antenna performance and circuit behaviour in eDesignSuite, access accurate CAD models through Ultra Librarian, and source components directly from DigiKey, all without breaking their design flow. For teams working on NFC reader designs or dynamic tag implementations using ST25 devices, this integration should reduce the friction between simulation, schematic capture, and procurement.</p>
<p>The announcement coincides with Embedded World 2026, held March 10-12 in Nuremberg, where DigiKey showcased products and demos including STMicroelectronics&#8217; STM32N6 platform.</p><p>The post <a href="https://www.rfidnews.co.uk/2026/03/19/digikey-collaborates-with-stmicroelectronics-and-ultra-librarian-to-deliver-enhanced-edesignsuite-integration/">DigiKey Collaborates with STMicroelectronics and Ultra Librarian to Deliver Enhanced eDesignSuite Integration</a> first appeared on <a href="https://www.rfidnews.co.uk">RFID News</a>.</p>]]></content:encoded>
					
		
		
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